USE OF ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI) IN THE MEASUREMENT OF STATIC AND DYNAMIC SURFACE DISPLACEMENTS

被引：72
|
作者：
WYKES, C
机构：
来源：
OPTICAL ENGINEERING | 1982年 / 21卷 / 03期
关键词：
D O I：
10.1117/12.7972922
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：400 / 406
页数：7
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