THIN-FILM INTERACTIONS OF AL AND AL (CU) ON W AND TI

被引：0
|
作者：
KRAFCSIK, I [1 ]
PALMSTROM, CJ [1 ]
GYULAI, J [1 ]
COLGAN, E [1 ]
ZINGU, E [1 ]
MAYER, JW [1 ]
机构：
[1] CORNELL UNIV,ITHACA,NY 14853
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1983年 / 130卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：C102 / C102
页数：1
相关论文
共 50 条
  • [41] DIFFUSION IN AL-NI THIN-FILM COUPLES
    BAGLIN, JEE
    DHEURLE, FM
    HO, PS
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (03) : C77 - C77
  • [42] DIFFUSION MARKERS IN AL/METAL THIN-FILM REACTIONS
    COLGAN, EG
    MAYER, JW
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 17 (03): : 242 - 249
  • [43] Electromigration transport mechanisms in Al thin-film conductors
    Oates, AS
    [J]. JOURNAL OF APPLIED PHYSICS, 1996, 79 (01) : 163 - 169
  • [44] Electromigration transport mechanisms in Al thin-film conductors
    [J]. J Appl Phys, 1 (163):
  • [45] Amorphization of Fe/Al: bulk and thin-film effects
    J. Noetzel
    D.C. Meyer
    A. Tselev
    A. Mücklich
    P. Paufler
    F. Prokert
    E. Wieser
    W. Möller
    [J]. Applied Physics A, 2000, 71 (1) : 47 - 54
  • [46] Amorphization of Fe/Al:: bulk and thin-film effects
    Noetzel, J
    Meyer, DC
    Tselev, A
    Mücklich, A
    Paufler, P
    Prokert, F
    Wieser, E
    Möller, W
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2000, 71 (01): : 47 - 54
  • [47] AGING OF FE-AL THIN-FILM MULTILAYERS
    CARBUCICCHIO, M
    PALOMBARINI, G
    RATEO, M
    [J]. JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES, 1995, 190 (02): : 263 - 277
  • [48] Interdiffusion at the Al2O3/Ti interface studied in thin-film structures
    Zalar, A
    Baretzky, B
    Dettenwanger, F
    Ruble, M
    Panjan, P
    [J]. SURFACE AND INTERFACE ANALYSIS, 1998, 26 (11) : 861 - 867
  • [49] Texture in Ti/Al and Nb/Al multilayer thin films: Role of Cu
    Lucadamo, G
    Barmak, K
    Rodbell, KP
    [J]. JOURNAL OF MATERIALS RESEARCH, 2001, 16 (05) : 1449 - 1459
  • [50] Texture in Ti/Al and Nb/Al multilayer thin films: Role of Cu
    G. Lucadamo
    K. Barmak
    K. P. Rodbell
    [J]. Journal of Materials Research, 2001, 16
12345