THERMAL FIELD-EMISSION FOR LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY

被引：7

|

作者：

ORLOFF, J

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 140卷

关键词：

D O I：

10.1111/j.1365-2818.1985.tb02684.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：303 / 311

页数：9

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