THERMAL FIELD-EMISSION FOR LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY

被引：7
|
作者：
ORLOFF, J
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 140卷
关键词：
D O I：
10.1111/j.1365-2818.1985.tb02684.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：303 / 311
页数：9
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