A HIGH-LEVEL TECHNIQUE FOR ESTIMATION AND OPTIMIZATION OF LEAKAGE POWER FOR FULL ADDER

被引:0
|
作者
Shrivas, Jayram [1 ]
Akashe, Shyam [2 ]
Tiwari, Nitesh [1 ]
机构
[1] ITM Univ, Gwalior 474011, Madhya Pradesh, India
[2] ITM Univ, Elect & Commun Dept, Gwalior 474011, Madhya Pradesh, India
关键词
PMOS; NMOS; leakage current; leakage power; CMOS; sleep transistor; VLSI;
D O I
10.1142/S0219581X13500117
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Optimization of power is a very important issue in low-voltage and low-power application. In this paper, we have proposed power gating technique to reduce leakage current and leakage power of one-bit full adder. In this power gating technique, we use two sleep transistors i.e., PMOS and NMOS. PMOS sleep transistor is inserted between power supply and pull up network. And NMOS sleep transistor is inserted between pull down network and ground terminal. These sleep transistors (PMOS and NMOS) are turned on when the circuit is working in active mode. And sleep transistors (PMOS and NMOS) are turned or when circuit is working in standby mode. We have simulated one-bit full adder and compared with the power gating technique using cadence virtuoso tool in 45 nm technology at 0.7V at 27 degrees C. By applying this technique, we have reduced leakage current from 2.935 pA to 1.905 pA and leakage power from 25.04 mu w to 9.233 mu w. By using this technique, we have reduced leakage power up to 63.12%.
引用
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页数:6
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