INTERFERENCE MEASURING METHODS FOR TESTING OPTICAL-ELEMENTS AND SYSTEMS

被引：0

作者：

KRSEK, J

机构：

来源：

OPTICA APPLICATA | 1984年 / 14卷 / 01期

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D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：83 / 93

页数：11

共 50 条

[21] BANDWIDTH OF HOLOGRAPHIC OPTICAL-ELEMENTS
STONE, T
GEORGE, N
[J]. OPTICS LETTERS, 1982, 7 (09) : 445 - 447
[22] OPTIMIZED HOLOGRAPHIC OPTICAL-ELEMENTS
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NAKASHIMA, M
[J]. FUJITSU SCIENTIFIC & TECHNICAL JOURNAL, 1994, 30 (02): : 137 - 143
[23] CALCULATION OF THE THERMAL REGIME OF THE PRINCIPAL OPTICAL-ELEMENTS OF PROJECTION SYSTEMS
NIFONTOVA, EG
SHRAMKO, YP
[J]. SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1986, 53 (09): : 546 - 549
[24] DESIGN AND FABRICATION OF MULTILEVEL DIFFRACTIVE OPTICAL-ELEMENTS (DOES) AND HOLOGRAPHIC OPTICAL-ELEMENTS (HOES)
STEMMER, A
ZARSCHIZKY, H
KNAPEK, E
LEFRANC, G
SCHERERWINNER, H
[J]. MICROELECTRONIC ENGINEERING, 1993, 21 (1-4) : 471 - 474
[25] RAY TRACING THROUGH SYSTEMS CONTAINING HOLOGRAPHIC OPTICAL-ELEMENTS
POWELL, I
[J]. APPLIED OPTICS, 1992, 31 (13): : 2259 - 2264
[26] OPTIMIZED HOLOGRAPHIC OPTICAL-ELEMENTS
KEDMI, J
FRIESEM, AA
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1986, 3 (12): : 2011 - 2018
[27] ANALYSIS OF LARGE ELECTRON-OPTICAL SYSTEMS WITH MANY INTERACTING OPTICAL-ELEMENTS
PETRIC, PF
BECK, VD
[J]. MICROELECTRONIC ENGINEERING, 1991, 13 (1-4) : 161 - 164
[28] MULTIFACET HOLOGRAPHIC OPTICAL-ELEMENTS
CASE, SK
LOKBERG, OJ
HAUGEN, P
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1980, 70 (12) : 1625 - 1625
[29] HOLOGRAPHIC OPTICAL-ELEMENTS (HOES)
CHANG, BJ
[J]. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 299 : 157 - 162
[30] ABSORPTION IN THE INTERFERENCE COATINGS OF OPTICAL-ELEMENTS OF INDUSTRIAL CO2-LASERS
GLEBOV, VN
MALYUTIN, AM
YAKUNIN, VP
[J]. SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1992, 59 (04): : 241 - 243

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