AFFECTED SIB-PAIR TESTS - OPTIMALITY PROPERTIES AND RELATIONSHIP TO LOD SCORE ANALYSIS

被引：0
|
作者：
KNAPP, M [1 ]
SEUCHTER, SA [1 ]
BAUR, MP [1 ]
机构：
[1] UNIV BONN,INST MED STAT,W-5300 BONN,GERMANY
来源：
AMERICAN JOURNAL OF HUMAN GENETICS | 1993年 / 53卷 / 03期
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D O I：
暂无
中图分类号：
Q3 [遗传学];
学科分类号：
071007 ; 090102 ;
摘要：
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页码：820 / 820
页数：1
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