TOLERANCE ASSIGNMENT FOR IC SELECTION TESTS

被引：7

|

作者：

MALY, W ^{[1
]}

PIZLO, Z ^{[1
]}

机构：

[1] WARSAW UNIV SCI & TECHNOL,DEPT ELECTR ENGN,PL-00661 WARSAW,POLAND

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1985年 / 4卷 / 02期

关键词：

D O I：

10.1109/TCAD.1985.1270109

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：156 / 162

页数：7

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