ON THE CONTRAST OF INTERFERENCE PATTERN DURING TESTING OF THE PROFILE OF ASPHERICAL SURFACES

被引：0
|
作者：
CHUNIN, BA
机构：
来源：
SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1990年 / 57卷 / 11期
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D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A solution is proposed that guarantees preservation of a high contrast for the interference pattern of surfaces having large gradients when the latter are measured by means of a polar-coordinate interferometer.
引用
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页码：689 / 690
页数：2
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