ON THE CONTRAST OF INTERFERENCE PATTERN DURING TESTING OF THE PROFILE OF ASPHERICAL SURFACES

被引:0
|
作者
CHUNIN, BA
机构
来源
SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1990年 / 57卷 / 11期
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D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A solution is proposed that guarantees preservation of a high contrast for the interference pattern of surfaces having large gradients when the latter are measured by means of a polar-coordinate interferometer.
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页码:689 / 690
页数:2
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