IMAGING CONDITIONS FOR RESOLVING OXYGEN-ATOMS IN ZRO2 BY AN ULTRA-HIGH-RESOLUTION HIGH-VOLTAGE ELECTRON-MICROSCOPE

被引：9
|
作者：
HORIUCHI, S
MATSUI, Y
机构：
[1] National Institute for Research in Inorganic Materials, Tsukuba, Ibaraki
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1992年 / 31卷 / 3A期
关键词：
IMAGING CONDITION; OXYGEN ATOMS; ZRO2; UHR-HVEM; HRTEM; STRUCTURE IMAGE; DEFOCUS VS THICKNESS MAP; CONTRAST REVERSAL; COMPUTER SIMULATION; OXYGEN DEFECTS;
D O I：
10.1143/JJAP.31.L283
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The imaging conditions for resolving oxygen atoms in ZrO2 are clarified based on real images by ultra-high-resolution high-voltage electron microscopy (UHR-HVEM) as well as on calculated ones by computer simulation. A defocus vs thickness map clearly defines an area of the so-called structure image, in which not only Zr but also oxygen atoms are resolved as dark spots. Additional areas with reversed contrast are noted. It is also revealed that defects of oxygen atoms can be imaged only in the structure image.
引用
收藏
页码：L283 / L286
页数：4
相关论文
共 50 条
  • [1] ATOMIC RESOLUTION IN THE HIGH-VOLTAGE ELECTRON-MICROSCOPE
    SMITH, DJ
    CAMPS, RA
    FREEMAN, LA
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1982, (61): : 381 - 386
  • [2] DIRECT OBSERVATION OF OXYGEN-ATOMS IN A TETRAGONAL YBA2CU3O7.7 HIGH-TC SUPERCONDUCTOR BY MEANS OF ULTRA-HIGH-RESOLUTION HIGH-VOLTAGE ELECTRON-MICROSCOPY
    HORIUCHI, S
    MATSUI, Y
    OKAI, B
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1992, 31 (1A-B): : L59 - L62
  • [3] HIGH-VOLTAGE ELECTRON-MICROSCOPE AUTORADIOGRAPHY
    HIROSAWA, K
    HAMA, K
    CELL STRUCTURE AND FUNCTION, 1980, 5 (04) : 389 - 389
  • [4] THE HIGH-VOLTAGE ELECTRON-MICROSCOPE IN VIROLOGY
    MAZZONE, HM
    WRAY, G
    ENGLER, WF
    ADVANCES IN VIRUS RESEARCH, 1985, 30 : 43 - 82
  • [5] SPUTTERING IN HIGH-VOLTAGE ELECTRON-MICROSCOPE
    CHERNS, D
    MINTER, FJ
    NELSON, RS
    NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F): : 369 - 376
  • [6] SPUTTERING IN THE HIGH-VOLTAGE ELECTRON-MICROSCOPE
    CHERNS, D
    SURFACE SCIENCE, 1979, 90 (02) : 339 - 356
  • [7] MICROPROBE IN A HIGH-VOLTAGE ELECTRON-MICROSCOPE
    CHAPMAN, PF
    STOBBS, WM
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (04): : 373 - 376
  • [8] ULTRA HIGH-RESOLUTION IMAGING WITH A TRANSMISSION ELECTRON-MICROSCOPE
    ISAKOZAWA, S
    TSURUTA, T
    SHINOHARA, M
    SATO, Y
    NOMURA, S
    KUBOZOE, M
    JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (03): : 249 - 250
  • [9] DESIGN OF 3.5MV ULTRA HIGH-VOLTAGE ELECTRON-MICROSCOPE
    URA, K
    FUJITA, H
    KATSUTA, T
    MATSUI, I
    KATAGIRI, S
    JOURNAL OF ELECTRON MICROSCOPY, 1989, 38 (04): : 297 - 297
  • [10] IMPROVEMENT OF RESOLUTION OF THE HIGH-VOLTAGE ELECTRON-MICROSCOPE BY MEANS OF AN ASYMMETRICAL LENS
    HONDA, T
    TSUNO, K
    WATANABE, H
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1982, (61): : 99 - 102
12345