COOLED MICROWAVE STRIPLINES FOR JOSEPHSON VOLTAGE STANDARDS

被引:0
|
作者
HINKEN, JH
POPEL, R
机构
来源
NTZ ARCHIV | 1983年 / 5卷 / 07期
关键词
D O I
暂无
中图分类号
TN [电子技术、通信技术];
学科分类号
0809 ;
摘要
引用
收藏
页码:211 / 217
页数:7
相关论文
共 50 条
  • [21] SERIES-ARRAY JOSEPHSON VOLTAGE STANDARDS
    KAUTZ, RL
    HAMILTON, CA
    LLOYD, FL
    IEEE TRANSACTIONS ON MAGNETICS, 1987, 23 (02) : 883 - 890
  • [22] Comparison of the Josephson voltage standards of VNIIM and PTB
    Behr, R
    Niemeyer, J
    Katkov, A
    2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 2000, : 251 - 252
  • [23] INTERNATIONAL COMPARISONS OF JOSEPHSON ARRAY VOLTAGE STANDARDS
    REYMANN, D
    WITT, TJ
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1993, 42 (02) : 596 - 599
  • [24] Nanotechnology for next generation Josephson voltage standards
    Benz, SP
    Dresselhaus, PD
    Burroughs, CJ
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (06) : 1513 - 1518
  • [25] Comparison of the Josephson voltage standards of the CEM and the BIPM
    Reymann, D
    Witt, TJ
    Balmisa, J
    Castejón, P
    Pérez, S
    METROLOGIA, 1999, 36 (01) : 59 - 62
  • [26] Comparison of the Josephson voltage standards of VNIIM and PTB
    Behr, R
    Niemeyer, J
    Katkov, AS
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (02) : 203 - 205
  • [27] NPL BIPM COMPARISON OF JOSEPHSON VOLTAGE STANDARDS
    HENDERSON, LCA
    REYMANN, D
    WITT, TJ
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1992, 3 (10) : 1011 - 1013
  • [28] Cryocooled Josephson standards for AC voltage metrology
    Durandetto, P.
    Sosso, A.
    Monticone, E.
    Trinchera, B.
    Fretto, M.
    Lacquaniti, V.
    7TH YOUNG RESEARCHER MEETING, 2017, 841
  • [29] Quality Assurance for Josephson Array Voltage Standards
    Zhou, Yinzhu
    Chua, Sze Wey
    Lee, Jinni
    Shan, Yueyan
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2011, 60 (07) : 2578 - 2583
  • [30] Comparison of the Josephson voltage standards of the IEN and the BIPM
    Reymann, D
    Witt, TJ
    Andreone, D
    Cerri, R
    Godone, A
    METROLOGIA, 1998, 35 (01) : 21 - 24