共 50 条
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- [3] THE CRITICAL VOLTAGE EFFECT IN HIGH-VOLTAGE ELECTRON-MICROSCOPYJOURNAL OF METALS, 1981, 33 (03): : 26 - 30FISHER, RMSHIRLEY, CG
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- [5] LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPYJOURNAL OF MICROSCOPY, 1984, 136 (OCT) : 45 - 68PAWLEY, J
- [6] SELECTIVE VOLTAGE CONTRAST AND VOLTAGE CODING IN SCANNING ELECTRON-MICROSCOPYULTRAMICROSCOPY, 1980, 5 (03) : 372 - 373GUASCO, CSOLDANI, D
- [7] HIGH-VOLTAGE ELECTRON-MICROSCOPY AND SCANNING ELECTRON-MICROSCOPY (EBIC MODE) OF THE SAME DISLOCATIONJOURNAL DE PHYSIQUE, 1979, 40 : 23 - 26HEYDENREICH, JBLUMTRITT, HGLEICHMANN, RJOHANSEN, H
- [8] RESOLUTION IN LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPYJOURNAL OF MICROSCOPY-OXFORD, 1985, 140 : 283 - 292JOY, DC
- [9] LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY OF POLYMERSPOLYMER, 1995, 36 (09) : 1781 - 1790BUTLER, JHJOY, DCBRADLEY, GFKRAUSE, SJ
- [10] LOW-VOLTAGE SCANNING ELECTRON-MICROSCOPY (LVSEM)INSTITUTE OF PHYSICS CONFERENCE SERIES, 1990, (98): : 439 - 442BOYES, ED