X-RAY SPECTROMETRY AND PERSONAL COMPUTERS

被引：0
|
作者：
LEYDEN, DE
机构：
来源：
TRAC-TRENDS IN ANALYTICAL CHEMISTRY | 1986年 / 5卷 / 02期
关键词：
D O I：
10.1016/0165-9936(86)85002-6
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：R7 / R8
页数：2
相关论文
共 50 条
  • [41] RADIOISOTOPE X-RAY SPECTROMETRY - A REVIEW
    RHODES, JR
    ANALYST, 1966, 91 (1088) : 683 - &
  • [42] Highlights of X-ray spectrometry for microanalysis
    Pella, PA
    Lankosz, M
    X-RAY SPECTROMETRY, 1997, 26 (06) : 327 - 332
  • [43] ANALYSIS OF SOLDERS BY X-RAY SPECTROMETRY
    ZANIN, SJ
    HOOSER, GE
    APPLIED SPECTROSCOPY, 1968, 22 (02) : 105 - &
  • [44] THE RECIPROCAL EVALUATION IN X-RAY SPECTROMETRY
    PLESCH, R
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1986, 325 (08): : 686 - 690
  • [45] RESIDUAL MATRIX IN X-RAY SPECTROMETRY
    PLESCH, R
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1979, 296 (04): : 266 - 269
  • [46] NONLINEAR APPROXIMATION IN X-RAY SPECTROMETRY
    PLESCH, R
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1974, 272 (01): : 6 - 10
  • [47] X-ray spectrometry systems for ITER
    Barnsley, R
    Edmonds, PH
    Giannella, RM
    O'Mullane, MG
    DIAGNOSTICS FOR EXPERIMENTAL THERMONUCLEAR FUSION REACTORS 2, 1998, : 307 - 318
  • [48] SAMPLE SPINNING IN X-RAY SPECTROMETRY
    ELLIS, AT
    LEYDEN, DE
    APPLIED SPECTROSCOPY, 1985, 39 (05) : 881 - 882
  • [49] X-RAY SPECTROMETRY WITH RADIOACTIVE SOURCES
    CAMERON, JF
    RHODES, JR
    NUCLEONICS, 1961, 19 (06): : 53 - &
  • [50] TOTAL REFLECTION X-RAY SPECTROMETRY
    LEYDEN, DE
    TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 1985, 4 (03) : R8 - R9
12345