NON-DESTRUCTIVE DARK RESISTIVITY PROFILING IN SI-GAAS USING MICROWAVE REFLECTION

被引：0
|
作者：
BORREGO, JM
BOTHRA, S
WANG, MS
PEARAH, P
机构：
来源：
SEMI-INSULATING III-V MATERIALS, MALMO 1988 | 1988年
关键词：
D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：521 / 524
页数：4
相关论文
共 50 条
  • [1] Non-destructive characterization of HgCdTe using photoinduced microwave reflection
    Spada, E.J.
    Rao, V.R.
    Bhat, I.
    Borrego, J.M.
    [J]. Semiconductor Science and Technology, 1993, 8 (6 S) : 936 - 940
  • [2] DESTRUCTIVE AND NON-DESTRUCTIVE DEPTH PROFILING USING ESCA
    SMITH, KL
    HAMMOND, JS
    [J]. APPLICATIONS OF SURFACE SCIENCE, 1985, 22-3 (MAY): : 288 - 298
  • [3] NON-DESTRUCTIVE CHARACTERIZATION OF GA1-XALXAS-GAAS INTERFACES USING NUCLEAR PROFILING
    ROSNER, JS
    LESSER, PMS
    POLLAK, FH
    WOODALL, JM
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03): : 584 - 588
  • [4] NON-DESTRUCTIVE EVALUATION OF SI WAFERS USING SAW
    DAS, P
    ROY, MK
    WEBSTER, RT
    VARAHRAMYAN, K
    [J]. IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1980, 27 (03): : 173 - 173
  • [5] Non-destructive evaluation of coatings using terahertz reflection spectroscopy
    Sachin, S. D. Siv
    Vijayan, Vivek
    Kini, Rajeev N.
    [J]. JOURNAL OF OPTICS, 2022, 24 (04)
  • [6] MICROWAVE INTERFEROMETER FOR NON-DESTRUCTIVE TESTING
    Choi, J.
    Breugnot, S.
    Itoh, T.
    [J]. REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 29A AND 29B, 2010, 1211 : 2092 - +
  • [7] PROFILING THE IMPLANTED REGION IN SI, USING NON-DESTRUCTIVE TRANSVERSE ACOUSTOELECTRIC VOLTAGE VERSUS VOLTAGE TECHNIQUE
    DAVARI, B
    DAS, P
    [J]. IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1983, 30 (03): : 210 - 210
  • [8] Non-destructive grading of mangosteen by using microwave moisture sensing
    Tongleam, T
    Jittiwarangkul, N
    Kumhom, P
    Chamnongthai, K
    [J]. IEEE INTERNATIONAL SYMPOSIUM ON COMMUNICATIONS AND INFORMATION TECHNOLOGIES 2004 (ISCIT 2004), PROCEEDINGS, VOLS 1 AND 2: SMART INFO-MEDIA SYSTEMS, 2004, : 650 - 653
  • [9] Non-Destructive Measurement of Equivalent Source Reflection Coefficient Using a Tuner
    Cui, Guangyan
    Li, Yong
    Yuan, Wenze
    Cui, Xiaohai
    Liu, Xiaomeng
    [J]. 2022 15TH UK-EUROPE-CHINA WORKSHOP ON MILLIMETRE-WAVES AND TERAHERTZ TECHNOLOGIES (UCMMT), 2022, : 11 - 13
  • [10] NON-DESTRUCTIVE EVALUATION OF GAAS BY AEV MEASUREMENTS
    VARAHRAMYAN, K
    DAS, P
    [J]. IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1982, 29 (03): : 166 - 166
12345