Non-destructive evaluation of coatings using terahertz reflection spectroscopy

被引:3
|
作者
Sachin, S. D. Siv [1 ]
Vijayan, Vivek [1 ]
Kini, Rajeev N. [1 ]
机构
[1] Indian Inst Sci Educ & Res Thiruvananthapuram IIS, Sch Phys, Maruthamala PO, Vithura 695551, Kerala, India
关键词
THz spectroscopy; non-destructive techniques; coatings; reflection spectroscopy; CROSS-CORRELATION SPECTROSCOPY; MULTIMODE LASER-DIODE; INCOHERENT-LIGHT; CONTINUOUS-WAVE; THICKNESS; SYSTEM; SENSOR; SPECTROMETER; IMPROVEMENT; COMPACT;
D O I
10.1088/2040-8986/ac54ea
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Terahertz time-domain spectroscopy (THz-TDS) provides a non-contact, non-destructive method for evaluating different materials and their properties. This short review discusses the commonly used numerical models for the non-destructive estimation of thickness, refractive index, surface and interface roughness of paints, thermal barrier coatings, and polymer coatings using THz-TDS in the reflection geometry. To demonstrate the applicability of these models, we used paint layers on metallic substrates and extracted different paraments by fitting the experimental THz-TDS data. We conclude by discussing further steps to improve the efficiency of the fitting procedure used to extract the layer parameters.
引用
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页数:11
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