THERMAL IMAGING-SYSTEMS PRINCIPLES

被引：0

作者：

LLOYD, M ^{[1
]}

机构：

[1] TEXAS INSTR INC,DALLAS,TX 75222

来源：

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：389 / 389

页数：1

共 50 条

[31] VLSI IN BIOMEDICAL IMAGING-SYSTEMS
SRIDHAR, R
JONES, T
COMPUTERIZED MEDICAL IMAGING AND GRAPHICS, 1995, 19 (01) : 161 - 169
[32] RETICLES FOR WAFER IMAGING-SYSTEMS
GOEDERS, T
SOLID STATE TECHNOLOGY, 1980, 23 (05) : 91 - 96
[33] MULTIFUNCTION ELECTRONIC IMAGING-SYSTEMS
FISLI, TS
ACTA POLYTECHNICA SCANDINAVICA-APPLIED PHYSICS SERIES, 1985, (150): : 130 - 131
[34] IR IMAGING-SYSTEMS/YSTEMS
BLACKBURN, H
SYSTEMS TECHNOLOGY, 1977, (26): : 15 - 21
[35] DEVICE NONSPECIFIC DYNAMIC PERFORMANCE-MODEL FOR THERMAL IMAGING-SYSTEMS
GAO, ML
KARIM, MA
ZHENG, SH
OPTICAL ENGINEERING, 1991, 30 (11) : 1779 - 1783
[36] APPARENT LIMITATIONS OF HEAD-UP-DISPLAYS AND THERMAL IMAGING-SYSTEMS
BRICKNER, MS
PROCEEDINGS OF THE FIFTH INTERNATIONAL SYMPOSIUM ON AVIATION PSYCHOLOGY, VOLS 1 AND 2, 1989, : 703 - 707
[37] ATMOSPHERIC LIMITATIONS ON IMAGING-SYSTEMS
SHAND, WA
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 467 : 157 - 161
[38] MICROPROCESSOR BASED RADIATION SOURCES AND RADIOMETERS FOR TESTING THERMAL IMAGING-SYSTEMS
FOURIER, R
BUCKWALD, RA
CABIB, D
SAPIR, E
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1985, 520 : 27 - 33
[39] SIMPLE MINIMUM RESOLVABLE TEMPERATURE DIFFERENCE MODEL FOR THERMAL IMAGING-SYSTEMS
CHRZANOWSKI, K
OPTICA APPLICATA, 1990, 20 (01) : 57 - 65
[40] COLOR SCIENCE FOR IMAGING-SYSTEMS
DEMARSH, LE
GIORGIANNI, EJ
PHYSICS TODAY, 1989, 42 (09) : 44 - 52