COMPARATIVE ESTIMATE OF ACCURACY OF VARIOUS METHODS OF X-RAY ANALYSIS FOR MATERIALS OF INHOMOGENEOUS COMPOSITION

被引：0
|
作者：
SMAGUNOV.AN
STAKHEEV.SA
LOSEV, NF
机构：
来源：
INDUSTRIAL LABORATORY | 1966年 / 32卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1314 / &
相关论文
共 50 条
  • [1] X-ray photoelectron spectroscopy: A perspective on quantitation accuracy for composition analysis of homogeneous materials
    Brundle, Christopher Richard
    Crist, Bruce Vincent
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2020, 38 (04):
  • [2] X-RAY RADIOMETRIC ANALYSIS OF ELEMENT COMPOSITION OF MATERIALS
    YAKUBOVICH, AL
    [J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1970, 5 (01): : 79 - +
  • [3] Determination accuracy of analysis refractory materials by X-ray fluorescence
    Janca, M.
    Siler, P.
    Opravil, T.
    Kotrla, J.
    [J]. INTERNATIONAL CONFERENCE BUILDING MATERIALS, PRODUCTS AND TECHNOLOGIES, 2018, 379
  • [4] Analysis of various Edge detection methods for X-ray images
    Goswami, Baishali
    Misra, Santanu Kr.
    [J]. 2016 INTERNATIONAL CONFERENCE ON ELECTRICAL, ELECTRONICS, AND OPTIMIZATION TECHNIQUES (ICEEOT), 2016, : 2694 - 2699
  • [5] DETERMINATION OF X-RAY ABSORPTION COEFFICIENTS OF INHOMOGENEOUS MATERIALS
    ERGUN, S
    TIENSUU, VH
    [J]. JOURNAL OF APPLIED PHYSICS, 1958, 29 (06) : 946 - 949
  • [6] MATERIALS AND METHODS OF X-RAY PROTECTION
    SINGER, G
    LAURENCE, GC
    [J]. RADIOLOGY, 1946, 46 (01) : 69 - 76
  • [7] APPLICATION OF X-RAY STRUCTURAL METHODS TO THE ANALYSIS OF METALLIC MATERIALS
    BUBLIK, VT
    IVANOV, AN
    SKAKOV, YA
    CHIRIKOV, NV
    [J]. INDUSTRIAL LABORATORY, 1982, 48 (02): : 166 - 174
  • [8] X-ray fluorescence analysis of multicomponent oxide materials: Accuracy control
    Institute for Single Crystals, Natl. Academy of Sciences of Ukraine, Lenin Ave. 60, 310001 Kharkov, Ukraine
    [J]. J Alloys Compd, (76-79):
  • [9] X-ray fluorescence analysis of multicomponent oxide materials: Accuracy control
    Mirenskaya, II
    Shevtsov, NI
    Blank, AB
    Belikov, KN
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 1999, 286 (1-2) : 76 - 79
  • [10] Accuracy in x-ray reflectivity analysis
    Tiilikainen, J.
    Tilli, J-M
    Bosund, V.
    Mattila, M.
    Hakkarainen, T.
    Sormunen, J.
    Lipsanen, H.
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2007, 40 (23) : 7497 - 7501
12345