X-ray fluorescence analysis of multicomponent oxide materials: Accuracy control

被引:0
|
作者
Institute for Single Crystals, Natl. Academy of Sciences of Ukraine, Lenin Ave. 60, 310001 Kharkov, Ukraine [1 ]
机构
来源
J Alloys Compd | / 76-79期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
下载
收藏
相关论文
共 50 条
  • [1] X-ray fluorescence analysis of multicomponent oxide materials: Accuracy control
    Mirenskaya, II
    Shevtsov, NI
    Blank, AB
    Belikov, KN
    JOURNAL OF ALLOYS AND COMPOUNDS, 1999, 286 (1-2) : 76 - 79
  • [2] Determination accuracy of analysis refractory materials by X-ray fluorescence
    Janca, M.
    Siler, P.
    Opravil, T.
    Kotrla, J.
    INTERNATIONAL CONFERENCE BUILDING MATERIALS, PRODUCTS AND TECHNOLOGIES, 2018, 379
  • [3] ANALYSIS OF MULTICOMPONENT SYSTEMS BY X-RAY FLUORESCENCE
    HOWER, J
    JONES, LC
    BURNHAM, HD
    SPECTROCHIMICA ACTA, 1956, 8 (02): : 114 - 115
  • [4] Routine control of accuracy in silicate rock analysis by X-ray fluorescence spectrometry
    Vendemiatto, MA
    Enzweiler, J
    GEOSTANDARDS NEWSLETTER-THE JOURNAL OF GEOSTANDARDS AND GEOANALYSIS, 2001, 25 (2-3): : 283 - 291
  • [5] MULTICOMPONENT X-RAY PROTECTIVE MATERIALS - AN ANALYTICAL STUDY WITH ALLOWANCE FOR FLUORESCENCE RERADIATION
    BELOV, GY
    KIRILLOV, VN
    BELOV, VG
    HIGH TEMPERATURE, 1994, 32 (02) : 204 - 209
  • [6] Comparison of Techniques of Melting in Sample Preparation for X-ray Fluorescence Analysis of Oxide Materials
    Vinklerova, Sarka
    CHEMICKE LISTY, 2009, 103 (09): : 740 - 743
  • [7] X-ray fluorescence trace analysis of materials (review)
    Kalinin, BD
    Plotnikov, RI
    INDUSTRIAL LABORATORY, 1998, 64 (02): : 85 - 93
  • [8] Determination of the composition of multicomponent chalcogenide semiconductors by X-ray fluorescence analysis
    G. A. Bordovskii
    A. V. Marchenko
    A. V. Nikolaeva
    P. P. Seregin
    E. I. Terukov
    Semiconductors, 2014, 48 : 257 - 262
  • [9] Determination of the composition of multicomponent chalcogenide semiconductors by X-ray fluorescence analysis
    Bordovskii, G. A.
    Marchenko, A. V.
    Nikolaeva, A. V.
    Seregin, P. P.
    Terukov, E. I.
    SEMICONDUCTORS, 2014, 48 (02) : 257 - 262
  • [10] Improved Accuracy of Multicomponent Samples Analysis by X-Ray Fluorescence Using Relative Intensities and Scattered Radiation: A Review
    Garmay, A. V.
    Oskolok, K. V.
    Monogarova, O. V.
    ANALYTICAL LETTERS, 2020, 53 (17) : 2685 - 2699