IMAGING OF STACKING-FAULTS IN HIGHLY ORIENTED PYROLYTIC-GRAPHITE USING SCANNING TUNNELING MICROSCOPY

被引：22
|
作者：
SNYDER, SR
FOECKE, T
WHITE, HS
GERBERICH, WW
机构：
[1] Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis
来源：
JOURNAL OF MATERIALS RESEARCH | 1992年 / 7卷 / 02期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1557/JMR.1992.0341
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Scanning tunneling microscopy images of the (0001) plane of highly oriented pyrolytic graphite show defect regions consisting of an extensive network of partial dislocations that form extended and contracted nodes. The partial dislocations in hexagonal graphite enclose triangular regions (approximately 1000 nm on a side) of faulted material comprised of rhombohedral graphite. Electronic and elastic interactions of the tip with the HOPG surface are proposed to explain the observed image contrast between hexagonal and rhombohedral graphite.
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页码：341 / 344
页数：4
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