SOME FACTORS AFFECTING DEPTH PROFILING MEASUREMENTS USING AUGER-ELECTRON SPECTROSCOPY

被引：12
|
作者：
HOOKER, MP [1 ]
GRANT, JT [1 ]
机构：
[1] UNIVERSAL ENERGY SYST INC,MEDWAY,OH 45341
来源：
SURFACE SCIENCE | 1975年 / 51卷 / 01期
关键词：
D O I：
10.1016/0039-6028(75)90259-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：328 / 332
页数：5
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