X-RAY PHOTOELECTRON DIFFRACTION STUDY OF THE ATOMIC GEOMETRY OF THE GE(III)(SQUARE-ROOT-3X-SQUARE-ROOT-3)R30-DEGREES-SN SURFACE

被引：0
|
作者：
SAKURAI, H [1 ]
HIGASHIYAMA, K [1 ]
KONO, S [1 ]
SAGAWA, T [1 ]
机构：
[1] TOHOKU UNIV,FAC SCI,DEPT PHYS,SENDAI,MIYAGI 980,JAPAN
来源：
SURFACE SCIENCE | 1983年 / 134卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
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页码：L550 / L556
页数：7
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