X-RAY PHOTOELECTRON DIFFRACTION STUDY OF THE ATOMIC GEOMETRY OF THE GE(III)(SQUARE-ROOT-3X-SQUARE-ROOT-3)R30-DEGREES-SN SURFACE

被引：0

作者：

SAKURAI, H ^{[1
]}

HIGASHIYAMA, K ^{[1
]}

KONO, S ^{[1
]}

SAGAWA, T ^{[1
]}

机构：

[1] TOHOKU UNIV,FAC SCI,DEPT PHYS,SENDAI,MIYAGI 980,JAPAN

来源：

SURFACE SCIENCE | 1983年 / 134卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：L550 / L556

页数：7

共 50 条

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[8] A STUDY OF THE SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-AG SURFACE BY TRANSMISSION-X-RAY DIFFRACTION AND X-RAY-DIFFRACTION TOPOGRAPHY
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