MBE APPARATUS FOR INSITU GRAZING-INCIDENCE X-RAY-DIFFRACTION

被引：11
|
作者：
AKIMOTO, K
MIZUKI, J
HIROSAWA, I
MATSUI, J
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 07期
关键词：
D O I：
10.1063/1.1140772
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：2362 / 2364
页数：3
相关论文
共 50 条
  • [41] PHOTOELECTRON YIELD IN X-RAY GRAZING-INCIDENCE DIFFRACTION
    IMAMOV, RM
    MUKHAMEDZHANOV, EK
    MASLOV, AV
    PASHAEV, EM
    AFANASEV, AM
    [J]. APPLICATIONS OF SURFACE SCIENCE, 1985, 22-3 (MAY): : 259 - 266
  • [42] A NEW SCHEME FOR X-RAY GRAZING-INCIDENCE DIFFRACTION
    CUI, SF
    MAI, ZH
    WU, LS
    WANG, CY
    DAI, DY
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (10): : 2419 - 2423
  • [43] DIFFRACTION OF AN X-RAY-BEAM WITH AN EXTREME GRAZING-INCIDENCE
    BRUNEL, M
    DEBERGEVIN, F
    [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1986, 42 : 299 - 303
  • [44] INSITU X-RAY-DIFFRACTION APPARATUS FOR METAL HYDRIDE STUDIES
    GAVRA, Z
    MURRAY, JJ
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08): : 1590 - 1592
  • [45] DETERMINATION OF THE FE LAYER STRUCTURE IN FE/RU SUPERLATTICES BY GRAZING-INCIDENCE ANGLE X-RAY-DIFFRACTION
    SAINTLAGER, MC
    BRUNEL, M
    RAOUX, D
    PIECUCH, M
    [J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1995, 148 (1-2) : 9 - 10
  • [46] In situ grazing-incidence x-ray-diffraction and electron-microscopic studies of small gold clusters
    Koga, K
    Takeo, H
    Ikeda, T
    Ohshima, K
    [J]. PHYSICAL REVIEW B, 1998, 57 (07): : 4053 - 4062
  • [47] INVESTIGATION OF THE INPLANE STRUCTURE OF PB AND NI STEARATE MULTILAYERS BY MEANS OF GRAZING-INCIDENCE X-RAY-DIFFRACTION
    BARBERKA, TA
    HOHNE, U
    PIETSCH, U
    METZGER, TH
    [J]. THIN SOLID FILMS, 1994, 244 (1-2) : 1061 - 1066
  • [48] DYNAMICAL X-RAY-DIFFRACTION PROFILES FOR ASYMMETRIC REFLECTION FROM CRYSTALS UNDER GRAZING-INCIDENCE CONDITIONS
    SAKATA, O
    HASHIZUME, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (10): : L1976 - L1979
  • [49] CHARACTERIZATION OF NANOMETER-SCALE EPITAXIAL STRUCTURES BY GRAZING-INCIDENCE X-RAY-DIFFRACTION AND SPECULAR REFLECTIVITY
    LUCAS, CA
    HATTON, PD
    BATES, S
    RYAN, TW
    MILES, S
    TANNER, BK
    [J]. JOURNAL OF APPLIED PHYSICS, 1988, 63 (06) : 1936 - 1941
  • [50] GRAZING-INCIDENCE X-RAY-DIFFRACTION FROM SI WITH AN IMPLANTATION INDUCED AMORPHOUS SURFACE-LAYER
    WALLNER, G
    BURKEL, E
    METZGER, H
    PEISL, J
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1988, 108 (01): : 129 - 133
12345