A HIGH-RESOLUTION, LOW-ENERGY ELECTRON DIFFRACTOMETER BASED ON A FIELD-EMISSION SOURCE

被引：12
|
作者：
MARTIN, JA [1 ]
LAGALLY, MG [1 ]
机构：
[1] UNIV WISCONSIN,CTR MAT SCI,MADISON,WI 53706
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1983年 / 1卷 / 02期
关键词：
D O I：
10.1116/1.571902
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：1210 / 1211
页数：2
相关论文
共 50 条
  • [31] Field-emission electron source for vacuum micropump
    Grzebyk, Tomasz
    Gorecka-Drzazga, Anna
    VACUUM, 2011, 86 (01) : 39 - 43
  • [32] Low-energy field emission Auger electron spectroscopy
    Forsyth, N.M.
    Bean, S.
    Surface and Interface Analysis, 1994, 22 (01) : 338 - 341
  • [33] Comparison of reflection high-energy electron diffraction and low-energy electron diffraction using high-resolution instrumentation
    Muller, B
    Henzler, M
    SURFACE SCIENCE, 1997, 389 (1-3) : 338 - 348
  • [34] HIGH-RESOLUTION DETECTION OF UNCOATED METAPHASE CHROMOSOMES BY MEANS OF FIELD-EMISSION SCANNING ELECTRON-MICROSCOPY
    RIZZOLI, R
    RIZZI, E
    FALCONI, M
    GALANZI, A
    BARATTA, B
    LATTANZI, G
    VITALE, M
    MANZOLI, L
    MAZZOTTI, G
    CHROMOSOMA, 1994, 103 (06) : 393 - 400
  • [35] A HIGH-RESOLUTION OBSERVATION IN LOW ACCELERATING VOLTAGE BY EMPLOYING AN IN-LENS-TYPE FIELD-EMISSION SEM
    SATO, M
    YAMADA, M
    WATANABE, T
    NAKAIZUMI, Y
    KANDA, K
    NAGATANI, T
    JOURNAL OF ELECTRON MICROSCOPY, 1987, 36 (05): : 330 - 330
  • [36] High-resolution measurements of low-energy conversion electrons
    Roussière, B
    Genevey, J
    Gizon, A
    Hojman, D
    Ibrahim, F
    Kilcher, P
    Knipper, A
    Le Blanc, F
    Marguier, G
    Obert, J
    Oms, J
    Putaux, JC
    Richard-Serre, C
    Sauvage, J
    Wojtasiewicz, A
    Forkel-Wirth, D
    Lettry, J
    HYPERFINE INTERACTIONS, 2000, 129 (1-4): : 119 - 129
  • [37] High-resolution measurements of low-energy conversion electrons
    B. Roussière
    J. Genevey
    A. Gizon
    D. Hojman
    F. Ibrahim
    P. Kilcher
    A. Knipper
    F. Le Blanc
    G. Marguier
    J. Obert
    J. Oms
    J.C. Putaux
    C. Richard-Serre
    J. Sauvage
    A. Wojtasiewicz
    D. Forkel-Wirth
    J. Lettry
    Hyperfine Interactions, 2000, 129 : 119 - 129
  • [38] ILLUMINATING SYSTEM FOR HIGH-RESOLUTION TRANSMISSION MICROSCOPY USING A FIELD-EMISSION SOURCE AND PREFIELD OF CONDENSER-OBJECTIVE
    HIBINO, M
    SIEGEL, BM
    JOURNAL OF APPLIED PHYSICS, 1972, 43 (02) : 657 - &
  • [39] FIELD-EMISSION GUN ON TEM - ADVANTAGES IN HIGH-RESOLUTION AND IN LINE FRAUNHOFER HOLOGRAPHY
    TROYON, M
    BONHOMME, P
    GALLION, P
    LABERRIGUE, A
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1976, 1 (03): : 517 - 518
  • [40] DESIGN AND APPLICATION OF A 100KV HIGH-RESOLUTION FIELD-EMISSION STEM
    ANDERSON, K
    DRUMMOND, IW
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1976, 1 (03): : 509 - 510
12345