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- [33] QUANTITATIVE X-RAY PHOTOELECTRON SPECTROSCOPIC (XPS) MEASUREMENT ON SURFACES OF GAAS(111), (111) AND (110) SINGLE-CRYSTALS - DETERMINATION OF RELATIVE PHOTO-AUGER IONIZATION CROSS-SECTIONS AND ELECTRON MEAN FREE PATHS BY USING CRYSTAL REGULARITY OF COMPOUND SEMICONDUCTORS JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 (05) : 797 - 803