STATE-OF-THE-ART IN MODERN X-RAY-FLUORESCENCE ANALYSIS

被引：0
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作者：
UHLIG, S
PETER, M
机构：
来源：
ANALUSIS | 1992年 / 20卷 / 08期
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中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
Modem elemental analysis using a wavelength-dispersive X-ray spectrometer ensures a non-destructive and environmentally safe analytical method. All elements from beryllium to uranium can be determined by qualitative, semi-quantitative and quantitative measurements in solids, powders & liquids.
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页码：M48 / M50
页数：3
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