EXPRESSION FOR INTRINSIC CARRIER CONCENTRATION IN HG1-XCDXTE

被引:3
|
作者
YADAVA, RDS
机构
[1] Solid State Physics Laboratory, Delhi, 110054, Lucknow Road
关键词
SEMICONDUCTORS; ELECTRONIC BAND STRUCTURE; ELECTRONIC TRANSPORT; GALVANOMAGNETIC EFFECTS;
D O I
10.1016/0038-1098(94)90717-X
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We present an accurate expression for intrinsic carrier concentration in Hg1-xCdxTe alloys obtained within the Kane's k.p band model. Based on certain heuristic assumptions and approximations, we have concluded the form, n(i) = zeta(N(c)N(upsilon))1/2 exp (- E(g)/2k(B)T) with zeta = g1/2phi(1 - phih)-1 where g, phi and h, respectively, are functions of epsilon = E(g)/k(B)T, gamma = (ge(epsilon) N(c)/N(upsilon))1/2 and N(c)/N(upsilon). The function zeta(epsilon, N(c)/N(upsilon)) represents correction (to the well known expression for non-degenerate parabolic semiconductors) due to the non-parabolicity and degeneracy of the k.p bands, and has been obtained mainly by numerical fittings. The present expression is accurate within 1% for all the alloys with chi greater-than-or-equal-to 0.17.
引用
收藏
页码:357 / 360
页数:4
相关论文
共 50 条
  • [1] INTRINSIC CARRIER CONCENTRATION IN HG1-XCDXTE
    HOSCHL, P
    MORAVEC, P
    GRILL, R
    FRANC, J
    BELAS, E
    [J]. CZECHOSLOVAK JOURNAL OF PHYSICS, 1990, 40 (01) : 48 - 56
  • [2] INTRINSIC CARRIER CONCENTRATION OF HG1-XCDXTE
    NEMIROVSKY, Y
    FINKMAN, E
    [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) : 8107 - 8111
  • [3] CALCULATION OF INTRINSIC CARRIER CONCENTRATION IN HG1-XCDXTE
    HANSEN, GL
    SCHMIT, JL
    [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (03) : 1639 - 1640
  • [4] INTRINSIC CARRIER CONCENTRATIONS AND EFFECTIVE MASSES IN HG1-XCDXTE
    MADARASZ, FL
    SZMULOWICZ, F
    MCBATH, JR
    [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (01) : 361 - 365
  • [5] EFFECT OF IONIZED INTRINSIC POINT-DEFECTS ON CURRENT-CARRIER CONCENTRATION IN HG1-XCDXTE
    LUTSIV, RV
    PETROV, PP
    RUD, NA
    MATVIIV, MV
    SOLSKII, IM
    [J]. INORGANIC MATERIALS, 1976, 12 (05): : 705 - 708
  • [6] DEFECT CHEMISTRY AND INTRINSIC CARRIER CONCENTRATION FOR HG1-XCDXTE(S) FOR X = 0.20, 0.40, AND 1.0
    SU, CH
    LIAO, PK
    BREBRICK, RF
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1983, 12 (05) : 771 - 826
  • [7] Study of the deep levels in Hg1-xCdxTe by using mobility and carrier concentration
    Li, XY
    Hu, XW
    Lu, HQ
    Zhao, J
    Fang, JX
    [J]. DETECTORS, FOCAL PLANE ARRAYS, AND IMAGING DEVICES II, 1998, 3553 : 71 - 76
  • [8] CALCULATION OF INTRINSIC CARRIER CONCENTRATION IN Hg1 - xCdxTe.
    Hansen, G.L.
    Schmit, J.L.
    [J]. 1639, (54):
  • [9] INTRINSIC CARRIER CONCENTRATIONS IN HG1-XCDXTE WITH THE USE OF FERMI-DIRAC STATISTICS
    MADARASZ, FL
    SZMULOWICZ, F
    [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (07) : 2770 - 2772