THE COMPLEMENTARY USE OF ATOM PROBE FIELD-ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY FOR THE STUDY OF A NI-BASE SUPERALLOY

被引：5

|

作者：

MELMED, AJ

TWIGG, ME

KLEIN, R

KAUFMAN, MJ

FRASER, HL

机构：

来源：

JOURNAL DE PHYSIQUE | 1984年 / 45卷 / NC9期

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D O I：

10.1051/jphyscol:1984962

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学科分类号：

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页码：373 / 378

页数：6

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