DESIGN OF BUILT-IN TEST CIRCUITS FOR COMBINATIONAL NETWORK DIAGNOSIS

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作者：

KHALCHEV, VF

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AUTOMATION AND REMOTE CONTROL | 1974年 / 35卷 / 03期

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TP [自动化技术、计算机技术];

学科分类号：

0812 ;

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页码：471 / 477

页数：7

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