A FAST IDENTIFICATION OF TRACES OF SILICON BY ACTIVATION ANALYSIS WITH 14 MEV NEUTRONS

被引：1
|
作者：
EDEN, Y
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS | 1967年 / 49卷 / 02期
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D O I：
10.1016/0029-554X(67)90707-0
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
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页码：352 / &
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