PRECISE MILLIMETER-WAVE MEASUREMENTS OF COMPLEX REFRACTIVE-INDEX, COMPLEX DIELECTRIC PERMITTIVITY AND LOSS TANGENT OF GAAS, SI, SIO2, AL2O3, BEO, MACOR, AND GLASS

被引：83
|
作者：
AFSAR, MN
BUTTON, KJ
机构：
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1983年 / 31卷 / 02期
关键词：
D O I：
10.1109/TMTT.1983.1131460
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：217 / 223
页数：7
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