USE OF ANTIREFLECTIVE COATING IN BILAYER RESIST PROCESS

被引:14
|
作者
LIN, YC
JONES, S
FULLER, G
机构
来源
关键词
D O I
10.1116/1.582749
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1215 / 1218
页数:4
相关论文
共 50 条
  • [21] Optimization of bottom antireflective coating materials for dual damascene process
    Ding, SJ
    Kang, WB
    Tanaka, H
    Dixit, S
    Eakin, R
    Shan, JH
    Gonzalez, E
    Liu, Y
    Khanna, DN
    ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XVII, PTS 1 AND 2, 2000, 3999 : 910 - 918
  • [22] Process development and impurities analysis for the bottom antireflective coating material
    Ko, FH
    Chen, HL
    Huang, TY
    Cheng, HC
    Ko, CJ
    Chu, TC
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XV, 2001, 4344 : 562 - 571
  • [23] Top antireflective coating process for deep-UV lithography
    Fung, A
    Mann, B
    Eakin, R
    Silvestre, P
    Williams, B
    Miyake, J
    Takano, Y
    MICROLITHOGRAPHY 1999: ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XVI, PTS 1 AND 2, 1999, 3678 : 967 - 977
  • [24] Characterization of solvent-rich resist coating process
    Zhou, B
    Denison, EV
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XIV, 2000, 3998 : 712 - 723
  • [25] Advanced resist coating technology for mask manufacturing process
    Kushida, Y
    Usui, Y
    Kobayashi, T
    Shigematsu, K
    OPTICAL MICROLITHOGRAPHY XII, PTS 1 AND 2, 1999, 3679 : 1001 - 1008
  • [26] Bilayer broadband antireflective coating to achieve planar heterojunction perovskite solar cells with 23.9% efficiency
    Wang, Yalun
    Wang, Hui
    Chen, Mengting
    Wang, Pang
    Mao, Yuchao
    Han, Wenjiao
    Wang, Tao
    Liu, Dan
    SCIENCE CHINA-MATERIALS, 2021, 64 (04) : 789 - 797
  • [27] THERMOLYSIS OF AN AZIDE-PHENOLIC RESIN COMPOSITE FILM AND ITS USE AS AN ANTIREFLECTIVE BOTTOM LAYER IN THE 3-LAYER RESIST PROCESS
    IWAYANAGI, T
    HASHIMOTO, M
    NONOGAKI, S
    SHIRAI, S
    MORIUCHI, N
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (04) : 963 - 967
  • [28] Technology for defectivity improvement in resist coating and developing process in EUV lithography process
    Kamei, Yuya
    Shiozawa, Takahiro
    Kawakami, Shinichiro
    Ichinomiya, Hiroshi
    Enomoto, Masashi
    Nafus, Kathleen
    Foubert, Philippe
    INTERNATIONAL CONFERENCE ON EXTREME ULTRAVIOLET LITHOGRAPHY 2017, 2017, 10450
  • [29] Technology for defectivity improvement in resist coating and developing process in EUV lithography process
    Kamei, Yuya
    Shiozawa, Takahiro
    Kawakami, Shinichiro
    Shite, Hideo
    Ichinomiya, Hiroshi
    Enomoto, Masashi
    Nafus, Kathleen
    Demand, Marc
    Foubert, Philippe
    EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY VIII, 2017, 10143
  • [30] Antireflective coating for BiPbSrCaCuO sensors
    Defence Research Establishment, Valcartier, Val-Belair, Canada
    IEEE Transactions on Applied Superconductivity, 1997, 7 (2 pt 3): : 2386 - 2389