DEVELOPMENT OF INDUSTRIAL X-RAY COMPUTED-TOMOGRAPHY AND ITS APPLICATION TO REFRACTORIES

被引：1
|
作者：
AIBA, Y [1 ]
OKI, K [1 ]
NAKAMURA, S [1 ]
FUJII, M [1 ]
机构：
[1] TOSHIBA CORP,DIV CAT,KAWASAKI 210,JAPAN
来源：
TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN | 1985年 / 71卷 / 14期
关键词：
D O I：
10.2355/tetsutohagane1955.71.14_1692
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：1692 / 1699
页数：8
相关论文
共 50 条
  • [1] DEVELOPMENT OF INDUSTRIAL X-RAY COMPUTED-TOMOGRAPHY AND ITS APPLICATION TO REFRACTORIES
    AIBA, Y
    OKI, K
    MATSUURA, S
    FUJII, M
    [J]. TRANSACTIONS OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1986, 26 (03) : 236 - 243
  • [2] THE APPLICATION OF X-RAY COMPUTED-TOMOGRAPHY TO MATERIALS DEVELOPMENT
    BOSSI, RH
    GEORGESON, GE
    [J]. JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 1991, 43 (09): : 8 - 15
  • [3] CHARACTERISTICS OF A SILICON DETECTOR FOR INDUSTRIAL X-RAY COMPUTED-TOMOGRAPHY
    MIYAI, H
    KITAGUCHI, H
    KAWASAKI, S
    IZUMI, S
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 353 (1-3): : 97 - 100
  • [4] X-ray micro computed-tomography
    Baird, Emily
    Taylor, Gavin
    [J]. CURRENT BIOLOGY, 2017, 27 (08) : R289 - R291
  • [5] APPLIED X-RAY COMPUTED-TOMOGRAPHY
    BUYNAK, CF
    BOSSI, RH
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 99 (1-4): : 772 - 774
  • [6] THE APPLICATION OF X-RAY CDTE DETECTORS IN THE MEDICAL COMPUTED-TOMOGRAPHY
    ARKADEVA, EN
    ZELENINA, NK
    KARPENKO, VP
    MASLOVA, LV
    MATVEEV, OA
    TERENTEV, AI
    TOMASOV, AA
    YAZYKOV, NN
    [J]. ZHURNAL TEKHNICHESKOI FIZIKI, 1985, 55 (05): : 897 - 901
  • [7] HIGH-ENERGY X-RAY COMPUTED-TOMOGRAPHY FOR INDUSTRIAL APPLICATIONS
    IZUMI, S
    KAMATA, S
    SATOH, K
    MIYAI, H
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1993, 40 (02) : 158 - 161
  • [8] Industrial X-ray computed tomography
    Pechstein, Torsten
    [J]. TM-TECHNISCHES MESSEN, 2020, 87 (02) : 79 - 80
  • [9] Industrial computed X-ray tomography
    Luthi, T
    Flisch, A
    Wyss, P
    [J]. INSIGHT, 1998, 40 (03) : 196 - 197
  • [10] TENDERING FOR AN X-RAY COMPUTED-TOMOGRAPHY SCANNER
    EDYVEAN, S
    PERRY, BJ
    [J]. BRITISH JOURNAL OF RADIOLOGY, 1987, 60 (716): : 834 - 834
12345