SEISMIC QUALIFICATION TESTING FOR HIGH-VOLTAGE EQUIPMENT

被引：0

|

作者：

ZOLA, M

SALVETTI, M

机构：

来源：

ELETTROTECNICA | 1988年 / 75卷 / 06期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：581 / 594

页数：14

相关论文

共 50 条

[21] Specification, performance, testing and qualification of extra-heavy-duty connectors for high-voltage applications
Lam, L
Morin, R
1996 IEEE TRANSMISSION AND DISTRIBUTION CONFERENCE PROCEEDINGS, 1996, : 307 - 313
[22] LARGE-MOTOR HIGH-VOLTAGE INSULATION SYSTEMS TESTING Qualification and acceptance for the petrochemical industry
Stranges, Meredith K. W.
Haq, Saeed
Teran, Luis H. A.
IEEE INDUSTRY APPLICATIONS MAGAZINE, 2016, 22 (06) : 33 - 38
[23] Specification, performance, testing and qualification of extra-heavy-duty connectors for high-voltage applications
Hydro-Quebec, Varennes, Canada
IEEE Trans Power Delivery, 2 (687-693):
[24] Specification, performance, testing and qualification of extra-heavy-duty connectors for high-voltage applications
Lam, L
Morin, R
IEEE TRANSACTIONS ON POWER DELIVERY, 1997, 12 (02) : 687 - 693
[25] Equipment for checking high-voltage measuring transformers
Nefed'ev, DI
MEASUREMENT TECHNIQUES, 2005, 48 (08) : 812 - 816
[26] Modelling of Microshocks Associated With High-Voltage Equipment
Gunatilake, Aruna
Ahmed, Yasir
Rowland, Simon M.
IEEE TRANSACTIONS ON POWER DELIVERY, 2009, 24 (01) : 202 - 207
[27] Gas chromatography for diagnostics of high-voltage equipment
Arakelyan, V.G.
Elektrotekhnika, 1994, (02): : 8 - 17
[28] Equipment for Checking High-Voltage Measuring Transformers
D. I. Nefed'ev
Measurement Techniques, 2005, 48 : 812 - 816
[29] The arcless method of testing high-voltage oil-filled equipment for explosion safety
Darian L.A.
Kozlov A.V.
Polishchuk V.P.
Povareshkin M.N.
Son E.E.
Fortov V.E.
Shurupov A.V.
Thermal Engineering, 2011, 58 (14) : 1196 - 1199
[30] High-voltage Testing on UHV Equipment: Overshoot and Base Curve for Oscillating Lightning Impulse
Matsumoto, Satoshi
Kawamura, Tatsuo
IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING, 2009, 4 (01) : 97 - 101

← 1 2 3 4 5 →