JUNCTION ELECTRON-BEAM-INDUCED CURRENT TECHNIQUES FOR THE ANALYSIS OF PHOTOVOLTAIC DEVICES

被引：0
|
作者：
MATSON, RJ
机构：
来源：
SCANNING MICROSCOPY | 1988年 / 2卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：121 / 127
页数：7
相关论文
共 50 条
  • [21] SCANNING ELECTRON-MICROSCOPE MODIFICATIONS FOR ELECTRON-BEAM INDUCED CURRENT ANALYSIS WITH APPLICATIONS TO PHOTOVOLTAIC MATERIALS AND DEVICES
    MATSON, RJ
    SCANNING ELECTRON MICROSCOPY, 1984, : 625 - 632
  • [22] ELECTRON-BEAM-INDUCED FUSION
    YONAS, G
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1974, 19 (01): : 85 - 85
  • [23] Investigation of nitride films by the electron-beam-induced current method
    Yakimov E.B.
    Journal of Surface Investigation, 2015, 9 (05): : 939 - 943
  • [24] ELECTRON-BEAM-INDUCED CURRENT INVESTIGATIONS OF OXYGEN PRECIPITATES IN SILICON
    JAKUBOWICZ, A
    HABERMEIER, HU
    JOURNAL OF APPLIED PHYSICS, 1985, 58 (03) : 1407 - 1409
  • [25] Submicrometer Hall devices fabricated by focused electron-beam-induced deposition
    Boero, G
    Utke, I
    Bret, T
    Quack, N
    Todorova, M
    Mouaziz, S
    Kejik, P
    Brugger, J
    Popovic, RS
    Hoffmann, P
    APPLIED PHYSICS LETTERS, 2005, 86 (04) : 042503 - 1
  • [26] Defect and field-enhancement characterization through electron-beam-induced current analysis
    Umezawa, Hitoshi
    Gima, Hiroki
    Driche, Khaled
    Kato, Yukako
    Yoshitake, Tsuyoshi
    Mokuno, Yoshiaki
    Gheeraert, Etienne
    APPLIED PHYSICS LETTERS, 2017, 110 (18)
  • [27] Repairing nanoscale devices using electron-beam-induced deposition of platinum
    Peeters, Lucas
    Keller, Andrew J.
    Umansky, Vladimir
    Mahalu, Diana
    Goldhaber-Gordon, David
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2015, 33 (05):
  • [28] ELECTRON-BEAM-INDUCED CURRENTS COLLECTED BY A P-N-JUNCTION OF FINITE JUNCTION DEPTH
    SOUKUP, RJ
    EKSTRAND, JP
    JOURNAL OF APPLIED PHYSICS, 1985, 57 (12) : 5386 - 5395
  • [29] Electron-beam-induced current and cathodoluminescence characterization of InGaAs strain-balanced multiquantum well photovoltaic cells
    Tundo, S., 1600, American Institute of Physics Inc. (94):
  • [30] Electron-beam-induced current and cathodoluminescence characterization of InGaAs strain-balanced multiquantum well photovoltaic cells
    Tundo, S
    Mazzer, M
    Nasi, L
    Lazzarini, L
    Salviati, G
    Rohr, C
    Abbott, P
    Bushnell, DB
    Barnham, KWJ
    Clarke, G
    Peng, RW
    JOURNAL OF APPLIED PHYSICS, 2003, 94 (10) : 6341 - 6345
12345