ANALYSIS OF HIGH-RESOLUTION AUGER AND X-RAY PHOTOELECTRON-SPECTRA FROM THIN OXIDE-FILMS ON ALUMINUM

被引：0
|
作者：
RIBARSKY, MW [1 ]
SCHEIBNER, EJ [1 ]
机构：
[1] GEORGIA INST TECHNOL,ATLANTA,GA
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1976年 / 21卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：432 / 432
页数：1
相关论文
共 50 条
  • [21] HIGH-RESOLUTION PHOTOELECTRON-SPECTRA OF DEUTERATED ETHYLENES
    CVITAS, T
    GUSTEN, H
    KLASINC, L
    JOURNAL OF CHEMICAL PHYSICS, 1979, 70 (01): : 57 - 60
  • [22] SATELLITES IN THE X-RAY PHOTOELECTRON-SPECTRA OF METALLOPORPHYRINS
    MURALIDHARAN, S
    HAYES, RG
    JOURNAL OF CHEMICAL PHYSICS, 1979, 71 (07): : 2970 - 2974
  • [23] X-RAY PHOTOELECTRON-SPECTRA OF METHYLLITHIUM AND DILITHIOMETHANE
    MEYERS, GF
    HALL, MB
    CHINN, JW
    LAGOW, RJ
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1985, 107 (05) : 1413 - 1414
  • [24] ANALYSIS OF X-RAY PHOTOELECTRON-SPECTRA THROUGH THEIR EVEN DERIVATIVES
    PAVLATH, AE
    MILLARD, MM
    APPLIED SPECTROSCOPY, 1979, 33 (05) : 502 - 509
  • [25] X-RAY PHOTOELECTRON-SPECTRA OF ANTIMONY OXIDES
    IZQUIERDO, R
    SACHER, E
    YELON, A
    APPLIED SURFACE SCIENCE, 1989, 40 (1-2) : 175 - 177
  • [26] X-RAY PHOTOELECTRON-SPECTRA OF COBALT COMPOUNDS
    FROST, DC
    MCDOWELL, CA
    WOOLSEY, IS
    MOLECULAR PHYSICS, 1974, 27 (06) : 1473 - 1489
  • [27] X-RAY AND UV PHOTOELECTRON-SPECTRA OF DIFLUOROBENZENES
    DAVIES, DW
    CHEMICAL PHYSICS LETTERS, 1977, 48 (03) : 565 - 567
  • [28] X-RAY PHOTOELECTRON-SPECTRA OF HEXAVALENT IRON
    KONNO, H
    NAGAYAMA, M
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 18 (04) : 341 - 343
  • [29] INNER VALENCE SATELLITE STRUCTURE IN HIGH-RESOLUTION X-RAY EXCITED PHOTOELECTRON-SPECTRA OF N-2 AND CO
    SVENSSON, S
    CARLSSONGOTHE, M
    KARLSSON, L
    NILSSON, A
    MARTENSSON, N
    GELIUS, U
    PHYSICA SCRIPTA, 1991, 44 (02): : 184 - 190
  • [30] X-RAY AND X-RAY PHOTOELECTRON-SPECTRA OF VANADIUM-OXIDES
    WERFEL, F
    DRAGER, G
    BERG, U
    CRYSTAL RESEARCH AND TECHNOLOGY, 1981, 16 (01) : 119 - 126
12345