ANALYSIS OF HIGH-RESOLUTION AUGER AND X-RAY PHOTOELECTRON-SPECTRA FROM THIN OXIDE-FILMS ON ALUMINUM

被引：0
|
作者：
RIBARSKY, MW [1 ]
SCHEIBNER, EJ [1 ]
机构：
[1] GEORGIA INST TECHNOL,ATLANTA,GA
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1976年 / 21卷 / 03期
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D O I：
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：432 / 432
页数：1
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