SINGLE-SHOT MEASUREMENT OF THE AMPLITUDE AND PHASE OF ULTRASHORT LASER-PULSES IN THE VIOLET

Using single-shot, self-diffraction, frequency-resolved optical gating, we measure the complete electric field amplitude and phase of 405-nm second-harmonic pulses from an amplified Ti:sapphire system. The single-shot frequency-resolved optical gating device gives both qualitative and quantitative information, which is useful for analyzing and optimizing the grating compressor in the chirped-pulse amplification system.