GUN BRIGHTNESS MEASUREMENTS IN A TRANSMISSION ELECTRON-MICROSCOPE

被引：0

作者：

CAPILUPPI, C

VALDRE, U

机构：

[1] UNIV BOLOGNA,CTR MICROSCOPIA ELETTR,DIPARTIMENTO FIS,I-40126 BOLOGNA,ITALY

[2] UNIV BOLOGNA,GRP NAZL SCI MAT,CTR IND SCI MAT,I-40126 BOLOGNA,ITALY

来源：

ULTRAMICROSCOPY | 1990年 / 32卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：208 / 208

页数：1

共 50 条

[41] SIZE OF ELECTRON SOURCE IN A FIELD-EMISSION GUN FOR AN ELECTRON-MICROSCOPE
EDELSTEIN, GB
RADIOTEKHNIKA I ELEKTRONIKA, 1978, 23 (03): : 584 - 590
[42] LATTICE-PARAMETER AND LATTICE STRAIN-MEASUREMENTS IN THE TRANSMISSION ELECTRON-MICROSCOPE
FRASER, HL
JOURNAL OF METALS, 1987, 39 (07): : A15 - A15
[43] ON THE IMAGE BRIGHTNESS OF THE TRENCH BOTTOM SURFACE IN A SCANNING ELECTRON-MICROSCOPE
HARAFUJI, K
NOMURA, N
KOUDA, T
JOURNAL OF APPLIED PHYSICS, 1992, 72 (07) : 2541 - 2549
[44] GUN SHOT RESIDUE AND FORENSIC APPLICATION OF THE SCANNING ELECTRON-MICROSCOPE
PADEN, RS
JOURNAL OF THE FORENSIC SCIENCE SOCIETY, 1984, 24 (04): : 453 - 454
[45] OPTIMUM CONDITION FOR ELECTRON-MICROSCOPE GUN GEOMETRIES .2.
OHYE, T
SHIMOYAM.H
MARUSE, S
JOURNAL OF ELECTRON MICROSCOPY, 1973, 22 (03): : 281 - 281
[46] ATOMIC AND MOLECULAR IMAGING WITH THE TRANSMISSION ELECTRON-MICROSCOPE
SHARP, JA
BYRD, D
BROWN, RM
PLANT PHYSIOLOGY, 1995, 108 (02) : 137 - 137
[47] ELECTRONIC CONE ILLUMINATION WITH TRANSMISSION ELECTRON-MICROSCOPE
KRAKOW, W
JOURNAL OF ELECTRON MICROSCOPY, 1977, 26 (02): : 181 - 181
[48] AN ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPE FOR ESI AND EELS
ENGLE, W
KURZ, D
RILK, A
AMERICAN LABORATORY, 1984, 16 (12) : 26 - &
[49] TRANSMISSION ELECTRON-MICROSCOPE OBSERVATIONS OF ILLITE POLYTYPISM
GRUBB, SMB
PEACOR, DR
JIANG, WT
CLAYS AND CLAY MINERALS, 1991, 39 (05) : 540 - 550
[50] TRANSMISSION ELECTRON-MICROSCOPE STUDIES OF CRACKS IN QUARTZ
DURHAM, WB
TRANSACTIONS-AMERICAN GEOPHYSICAL UNION, 1973, 54 (04): : 450 - &

← 1 2 3 4 5 →