MEASUREMENT OF BIREFRINGENCE, DISPERSION AND LINE SPLITTING FOR BIAXIAL CRYSTALS BY DOUBLE-LAYER INTERFEROMETER

被引:10
|
作者
KHASHAN, MA
NASSIF, AY
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D O I
10.1080/09500348914550851
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
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页码:785 / 796
页数:12
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