INSTRUMENTAL PROBLEMS OF ELECTRON-MICROPROBE AUGER-SPECTROSCOPY

被引：0

|

作者：

ONO, M ^{[1
]}

SHIMIZU, H ^{[1
]}

NAKAYAMA, K ^{[1
]}

机构：

[1] ELECTROTECH LAB,TANASHI 188,TOKYO,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1974年

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中图分类号：

O59 [应用物理学];

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页码：359 / 362

页数：4

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