INSTRUMENTAL PROBLEMS OF ELECTRON-MICROPROBE AUGER-SPECTROSCOPY

被引：0
|
作者：
ONO, M [1 ]
SHIMIZU, H [1 ]
NAKAYAMA, K [1 ]
机构：
[1] ELECTROTECH LAB,TANASHI 188,TOKYO,JAPAN
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1974年
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D O I：
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中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：359 / 362
页数：4
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