INSITU X-RAY-DIFFRACTOMETRY OF EVAPORATED THIN-FILMS - APPLICATION TO AMORPHOUS TELLURIUM

被引：3

作者：

MALAURENT, JC ^{[1
]}

DIXMIER, J ^{[1
]}

机构：

[1] LAB PHYS SOLIDES,91405 ORSAY,FRANCE

来源：

THIN SOLID FILMS | 1976年 / 32卷 / 02期

关键词：

D O I：

10.1016/0040-6090(76)90339-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：370 / 370

页数：1

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