共 50 条
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- [32] SURFACE MICROEXTENSOMETRY BY MEANS OF MOIRE INTERFEROMETRY WITH A SCANNING ELECTRON-MICROSCOPE JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1987, 54 (01): : 237 - 239
- [33] PRODUCTION OF SMALL FIDUCIAL MARKS BY MEANS OF SCANNING ELECTRON-MICROSCOPE REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (09): : 1286 - 1287
- [35] PHASE-CONTRAST IS SCANNING-TRANSMISSION ELECTRON-MICROSCOPE (STEM) - APPLICATION TO ATOMIC PHASE VISIBILITY JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1976, 1 (03): : 515 - 516
- [36] FORMATION OF BACKSCATTERED ELECTRON CONTRAST FROM BALK MICROINHOMOGENEITIES IN SCANNING ELECTRON-MICROSCOPE IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1990, 54 (02): : 237 - 242
- [38] MAGNETIC DOMAIN CONTRAST IN BACKSCATTERED ELECTRON IMAGES OBTAINED WITH A SCANNING ELECTRON-MICROSCOPE PHILOSOPHICAL MAGAZINE, 1976, 34 (02): : 311 - 325