IMAGE QUALITY METRICS

被引:0
|
作者
JACOBSON, RE
机构
来源
JOURNAL OF PHOTOGRAPHIC SCIENCE | 1995年 / 43卷 / 02期
关键词
D O I
暂无
中图分类号
TB8 [摄影技术];
学科分类号
0804 ;
摘要
引用
收藏
页码:42 / 43
页数:2
相关论文
共 50 条
  • [1] Image compression quality metrics
    Szu, H
    Hsu, C
    Landa, J
    Jones, T
    OKane, B
    OConnor, J
    Murenzi, R
    Smith, M
    [J]. WAVELET APPLICATIONS IV, 1997, 3078 : 42 - 55
  • [2] On Monotonicity of Image Quality Metrics
    Zhai, Guangtao
    Wu, Xiaolin
    [J]. 2012 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH AND SIGNAL PROCESSING (ICASSP), 2012, : 1157 - 1160
  • [3] AN EVALUATION OF IMAGE QUALITY METRICS
    JACOBSON, RE
    [J]. JOURNAL OF PHOTOGRAPHIC SCIENCE, 1995, 43 (01): : 7 - 16
  • [4] Image metrics for predicting subjective image quality
    Chen, L
    Singer, B
    Guirao, A
    Porter, J
    Williams, DR
    [J]. OPTOMETRY AND VISION SCIENCE, 2005, 82 (05) : 358 - 369
  • [5] Image quality metrics for the evaluation of print quality
    Pedersen, Marius
    Bonnier, Nicolas
    Hardeberg, Jon Y.
    Albregtsen, Fritz
    [J]. IMAGE QUALITY AND SYSTEM PERFORMANCE VIII, 2011, 7867
  • [6] A Review of Quality Metrics for Fused Image
    Jagalingam, P.
    Hegde, Arkal Vittal
    [J]. INTERNATIONAL CONFERENCE ON WATER RESOURCES, COASTAL AND OCEAN ENGINEERING (ICWRCOE'15), 2015, 4 : 133 - 142
  • [7] Image quality metrics for printers and media
    Kipman, Y
    [J]. IMAGE PROCESSING IMAGE QUALITY IMAGE CAPTURE SYSTEMS CONFERENCE, 1998, : 183 - 187
  • [8] Optical quality metrics for image restoration
    Mueller, Patrick
    Lehmann, Matthias
    Braun, Alexander
    [J]. DIGITAL OPTICAL TECHNOLOGIES 2019, 2019, 11062
  • [9] The SNCD as a Metrics for Image Quality Assessment
    Roman-Gonzalez, Avid
    [J]. INTERNATIONAL JOURNAL OF ADVANCED COMPUTER SCIENCE AND APPLICATIONS, 2013, 4 (07) : 40 - 47
  • [10] Image quality metrics: Applications and requirements
    Rasmussen, DR
    Crean, PA
    Nakaya, F
    Sato, M
    Dalal, EN
    [J]. IMAGE PROCESSING IMAGE QUALITY IMAGE CAPTURE SYSTEMS CONFERENCE, 1998, : 174 - 178