METHOD FOR MEASUREMENTS OF SENSITIVE LAYER THICKNESS OF SEMICONDUCTOR-DETECTORS

被引：0

作者：

ILYASOV, AZ ^{[1
]}

MAZITOV, BS ^{[1
]}

机构：

[1] ACAD SCI UZSSR,NUCL PHYS INST,ULUGBEK,UZSSR

来源：

PRIBORY I TEKHNIKA EKSPERIMENTA | 1974年 / 02期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：60 / 62

页数：3

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