SINGLE-CRYSTAL X-RAY-DIFFRACTION STUDY ON STRUCTURAL-CHANGE OF AGGAS2 WITH INCREASING PRESSURE

被引:4
|
作者
ISHIZAWA, N
KITAHARA, H
KOMORI, T
NODA, Y
MARUMO, F
机构
[1] Department of Materials Science, Tohoku University, Aramaki, Aoba-ku, Sendai
[2] Department of Earth Sciences, Nihon Universiry, Setagaya-ku, Tokyo, 156
[3] Research Laboratory of Engineering Materials, Tokyo Institute of Technology, Midori-ku, Yokohama, 227
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷
关键词
AGGAS2; SILVER THIOGALLATE; PHASE TRANSITION; HIGH PRESSURE; DIAMOND ANVIL; SINGLE-CRYSTAL X-RAY DIFFRACTION; CHALCOPYRITE-TYPE STRUCTURE;
D O I
10.7567/JJAPS.32S3.171
中图分类号
O59 [应用物理学];
学科分类号
摘要
Single-crystal X-ray diffraction study under high pressures has been carried out on silver thiogallate, AgGaS2, to investigate the phase transition at about 42 kbar. The crystal of AgGaS2 is tetragonal with the space group I42dBAR having the cell dimensions a = 5.7603(6) and c = 10.299(2) angstrom under the ambient pressure. The high-pressure form has a similar unit cell to that of the ambient pressure form. The diffraction pattern around the [221BAR] zone axis at 47 kbar indicated that the high pressure form has weak but clear hhl reflections which do not satisfy the systematic absence condition, 2h + l = 4n, for the space group I42dBAR. It has been concluded that the diamond glide planes parallel to {110} present in the ambient pressure form disappear in the high pressure form.
引用
收藏
页码:171 / 172
页数:2
相关论文
共 50 条
  • [21] EXPERIMENT TECHNIQUE RESEARCH OF SINGLE-CRYSTAL X-RAY-DIFFRACTION UNDER HIGH-PRESSURE
    FAN, YG
    YU, JS
    MENG, Y
    XU, YQ
    ZOU, GT
    SCIENCE IN CHINA SERIES B-CHEMISTRY, 1990, 33 (08): : 920 - 928
  • [22] LOW-TEMPERATURE BAFFLE FOR SINGLE-CRYSTAL X-RAY-DIFFRACTION
    DERNIER, PD
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (06): : 931 - &
  • [23] INTERACTIVE COMPUTER GRAPHIC APPROACH TO SINGLE-CRYSTAL X-RAY-DIFFRACTION
    JOHNSON, GG
    MCILVRIED, KE
    STOCKER, FR
    ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 : S283 - S283
  • [24] STRUCTURE REFINEMENTS OF BERYL BY SINGLE-CRYSTAL NEUTRON AND X-RAY-DIFFRACTION
    ARTIOLI, G
    RINALDI, R
    STAHL, K
    ZANAZZI, PF
    AMERICAN MINERALOGIST, 1993, 78 (7-8) : 762 - 768
  • [25] STUDY OF THE MAGNETOSTRICTIVE DISTORTION IN SINGLE-CRYSTAL TERFENOL-D BY X-RAY-DIFFRACTION
    ALJIBOORY, M
    LORD, DG
    IEEE TRANSACTIONS ON MAGNETICS, 1990, 26 (05) : 2583 - 2585
  • [26] CDTE THERMAL PARAMETERS STUDIED BY SINGLE-CRYSTAL X-RAY-DIFFRACTION
    HORNING, RD
    STAUDENMANN, JL
    PHYSICAL REVIEW B, 1987, 36 (05): : 2873 - 2874
  • [27] OPTIMIZATION OF SCAN PROCEDURE FOR SINGLE-CRYSTAL X-RAY-DIFFRACTION INTENSITIES
    KILLEAN, RCG
    ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (MAR1): : 216 - 217
  • [28] X-RAY-DIFFRACTION BY PHOSPHOLIPID MONOLAYERS ON SINGLE-CRYSTAL SILICON SUBSTRATES
    SEUL, M
    EISENBERGER, P
    MCCONNELL, HM
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA-PHYSICAL SCIENCES, 1983, 80 (18): : 5795 - 5797
  • [29] SINGLE-CRYSTAL X-RAY-DIFFRACTION STUDIES OF CYCLOHEXANE I AND II
    KAHN, R
    FOURME, R
    RENAUD, M
    ANDRE, D
    ACTA CRYSTALLOGRAPHICA SECTION A, 1972, 28 : S182 - S182
  • [30] REDETERMINATION OF THE STRUCTURE OF BARIUM PEROXIDE BY SINGLE-CRYSTAL X-RAY-DIFFRACTION
    VERNOOY, PD
    ACTA CRYSTALLOGRAPHICA SECTION C-CRYSTAL STRUCTURE COMMUNICATIONS, 1993, 49 (03) : 433 - 434