The influence of finite conductor-thickness of components with small lateral measurements, as interdigitated capacitances, planar inductors, interdigitated couplers and interdigital filters can not be neglected for accurate analysis of thin film and monolithic integrated circuits. In this paper a simple method for calculating approximately the characteristics of multi-conductor-structures of microstrips with finite thickness is presented. Conductors of both rectangular and trapezoidal cross-section are analyzed. For verification of the method results for the simple and for coupled microstrip-lines with finite thickness are given.