EFFECT OF THICKNESS ON THE OPTICALPROPERTIES OF ZINC SELENIDE THIN FILMS

被引：0
|
作者：
Okereke, N. A. [1 ]
Ezenwa, I. A.
Ekpunobi, A. J. [2 ]
机构：
[1] Anambra State Univ, Dept Ind Phys, Uli, Anambra, Nigeria
[2] Nnamdi Azikiwe Univ, Dept Phys & Ind Phys, Awka, Anambra, Nigeria
来源：
JOURNAL OF NON-OXIDE GLASSES | 2011年 / 3卷 / 03期
关键词：
Semiconductor; thin film; Zinc selenide; chemical bath; characterization; application;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The zinc selenide (ZnSe) thin films of thicknesses 1.60 mu m and 1.64 mu m were chemically deposited on well cleaned glass substrate at room temperature. The films are polycrystalline with cubic structure, confirmed by x-ray diffractogram. The optical spectra of zinc selenide thin films were recorded in the wavelength range of 0.36 mu m and 1.10 mu m. The spectral absorption data shows that the films absorb in the ultra violet range of 0.360.45 microns and have almost zero absorbance in VIS-IR regions of the spectrum. The films have average index of refraction of 2.0. The plot of a(2) versus h(Sic) (showed a direct band gap range of 2.70eV-2.75eV. The band gap is found to decrease with increase in film thickness.
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页码：105 / 111
页数：7
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